JFLI Seminar on Augmented Reality

Date: Tuesday March 13, 2017

Time: 11:00

Place: NII, room 1902

Title: Augmented Visualization of Reality from Collection of Images

Speaker: Hideo Saito (Keio University)

In this talk, I will present a future trend of visual processing in which the amount of images captured by various devices is extremely increasing. While machine learning has made drastic improvement based on the huge amount of image data, we need to achieve the innovative visualization technology using huge amount of image data. I believe that one of such trends is augmenting visual reality based on multi-dimensional visual information analysis for providing intuitive understanding using collection of various images. I will show some preliminary example research directions based on the collection images.

Hideo Saito received his Ph.D. degree in electrical engineering from Keio University, Japan, in 1992. Since then, he has been on the Faculty of Science and Technology, Keio University. From 1997 to 1999, he joined the Virtualized Reality Project in the Robotics Institute, Carnegie Mellon University as a visiting researcher. Since 2006, he has been a full professor in the Department of Information and Computer Science, Keio University. His recent activities for academic conferences include being a Program Chair of ACCV2014, a General Chair of ISMAR2015, and a Program Chair of ISMAR2016. His research interests include computer vision and pattern recognition, and their applications to augmented reality, virtual reality, and human robotics interaction. He received awards including Best Paper Award in 3DSA2010, Best Paper Award in VSMM2010, Honorable Mention for Best Short Paper in IEEE VR 2011, Most Influential Paper over the Decade Award of MVA 2000, Jon Campbell Best Paper Prize in IMVIP2014, and a Best Paper in Electronic Imaging 2016. He is a Fellow of the Institute of Electronics, Information and Communication Engineers (IEICE), a Fellow of Virtual Reality Society of Japan (VRSJ), and a senior member of IEEE.

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